NSN 5845-14-042-5438, 5845140425438
CARTE IMPRIMEE,EQUI

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BODY HEIGHT: (ADAU) 0.135 INCHES MINIMUM AND 0.150 INCHES MAXIMUM
BODY LENGTH: (ADAQ) 0.745 INCHES MINIMUM AND 0.770 INCHES MAXIMUM
BODY WIDTH: (ADAT) 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM
CASE OUTLINE SOURCE AND DESIGNATOR: (CTFT) MO-001-AB JOINT ELECTRON DEVICE ENGINEERING COUNCIL
DESIGN FUNCTION AND QUANTITY: (CSSL) 4 GATE, OR
FEATURES PROVIDED: (CBBL) HERMETICALLY SEALED AND HIGH VOLTAGE AND HIGH CURRENT
INCLOSURE CONFIGURATION: (CQSZ) DUAL-IN-LINE
INCLOSURE MATERIAL: (CQSJ) CERAMIC AND GLASS
INPUT CIRCUIT PATTERN: (CQZP) QUAD 2 INPUT
MAXIMUM POWER DISSIPATION RATING: (AEHX) 500.0 MILLIWATTS
OPERATING TEMP RANGE: (AFGA) -55.0 TO 125.0 CELSIUS
OUTPUT LOGIC FORM: (CQWX) COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
STORAGE TEMP RANGE: (AFJQ) -65.0 TO 150.0 CELSIUS
TIME RATING PER CHACTERISTIC: (CZEQ) 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
OPERATING TEMP RANGE: (AFGA) -55.0 TO 125.0 DEG CELSIUS
OPERATING TEMP RANGE: (AFGA) -55.0/+125.0 DEG CELSIUS
STORAGE TEMP RANGE: (AFJQ) -65.0 TO 150.0 DEG CELSIUS
STORAGE TEMP RANGE: (AFJQ) -65.0/+150.0 DEG CELSIUS