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NSN 5961-01-019-4934, 5961010194934
SEMICONDUCTOR DEVICE SET

Federal Supply Classification
FSC 5961 - Semiconductor Devices and Associated Hardware
National Item Identification Number
NIIN 010194934
Codification Country
United States
Item Name Code
INC 20590
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(N) There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials.
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DLMS® Summary

National Stock Number 5961-01-019-4934

National Stock Number (NSN) 5961-01-019-4934, or NIIN 010194934, (semiconductor device set) was assigned April 15, 1976 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 4 manufacturer part numbers associated with this NSN. 2 of those part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 10 suppliers. Today, 4 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, 3 suppliers are deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years, with the most recent procurement date of Jan 16, 2014. There have been 2 contracts issued for this part number, with 2 awards given. The US Government has only awarded those contracts to one supplier. The last contract numbers awarded were: SPM7M114M0112, SPM7M510M4573. The total value of the awarded contracts has been US$ 14,957.67.

This NSN is very common among different weapons systems, belonging to 32 different platforms.

There has been a small amount of demand for this national stock number. The demand for this NSN originated from less than 5 countries. Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Aug 01, 2020, this NSN's acquisition method was noted as: Suitable for Competitive Acquisition. (Potential sources shall include dealers/distributors.) Acquisition of this part is restricted to source(s) specified on "Source Control", "Altered Item" or "Selected Item" drawings/documents. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 20590. [A GROUPING OF TWO OR MORE INDIVIDUAL SEMICONDUCTOR DEVICES, SUCH AS TRANSISTORS, DIODES, AND PHOTO SEMICONDUCTOR DEVICES. IT INCLUDES MATCHED PAIRS. EXCLUDES:ABSORBER, OVERVOLTAGE; SEMICONDUCTOR DEVICE ASSEMBLY. FOR INTERCONNECTED ITEMS FUNCTIONING AS POWER SUPPLY RECTIFIERS, SEE RECTIFIER, SEMICONDUCTOR DEVICE.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials. NSN 5961010194934 contains gold.

This NSN is associated to Schedule B 8541500080: semiconductor devices, nesoi. The Schedule B End Use is listed as semiconductors. NAICS classification category 334413: semiconductor and related device manufacturing.

This information was last updated on .


Technical Characteristics

INCLOSURE MATERIAL
(ABBH) CERAMIC ALL SEMICONDUCTOR DEVICE DIODE
UNABLE TO DECODE
(ABBH) UNABLE TO DECODE
OVERALL HEIGHT
(ABKW) UNABLE TO DECODE
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) 95.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE
SEMICONDUCTOR MATERIAL
(CTMZ) UNABLE TO DECODE
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) UNABLE TO DECODE
OVERALL WIDTH
(ABMK) UNABLE TO DECODE
CAPACITANCE RATING IN PICOFARADS
(CTRG) 6.0 MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 6.7 MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
CAPACITANCE RATING IN PICOFARADS
(CTRG) 6.0 MINIMUM AND 6.7 MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
COMPONENT FUNCTION RELATIONSHIP
(ASDD) MATCHED
COMPONENT NAME AND QUANTITY
(ASKA) 4 SEMICONDUCTOR DEVICE DIODE
FUNCTION FOR WHICH DESIGNED
(AFZC) VOLTAGE VARIABLE CAPACITOR
OVERALL LENGTH
(ABHP) 0.975 INCHES NOMINAL ALL SEMICONDUCTOR DEVICE DIODE
OVERALL WIDTH
(ABMK) 0.127 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
MATERIAL
(MATT) CERAMIC ENCLOSURE ALL SEMICONDUCTOR DEVICE DIODE
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) 95.0 CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE
MOUNTING METHOD
(AXGY) TERMINAL ALL SEMICONDUCTOR DEVICE DIODE
OVERALL HEIGHT
(ABKW) 0.105 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
POWER RATING PER CHARACTERISTIC
(CTRD) 1.0 WATTS MAXIMUM TOTAL DEVICE DISSIPATION ALL SEMICONDUCTOR DEVICE DIODE
PRECIOUS MATERIAL AND LOCATION
(PMLC) LEADS PLATED GOLD
SEMICONDUCTOR MATERIAL
(CTMZ) SILICON ALL SEMICONDUCTOR DEVICE DIODE
TERMINAL TYPE AND QUANTITY
(TTQY) 2 RIBBON ALL SEMICONDUCTOR DEVICE DIODE
TEST DATA DOCUMENT
(TEST) 00724-20-00734 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC
(CTQN) 45.0 MINIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE
POWER RATING PER CHARACTERISTIC
(CTRD) 1.0 WATTS SMALL-SIGNAL INPUT POWER, COMMON-COLLECTOR ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE
POWER RATING PER CHARACTERISTIC
(CTRD) UNABLE TO DECODE
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC
(CTQN) UNABLE TO DECODE
MATERIAL
(MATT) CERAMIC INCLOSURE ALL SEMICONDUCTOR DEVICE DIODE
TERMINAL TYPE AND QUANTITY
(TTQY) UNABLE TO DECODE
OVERALL LENGTH
(ABHP) UNABLE TO DECODE
MOUNTING METHOD
(AXGY) UNABLE TO DECODE

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