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NSN 6625-00-179-5844, 6625001795844
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 001795844
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
Availability: Readily Available Qualified Suppliers: Currently qualifying suppliers

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DLMS® Summary

National Stock Number 6625-00-179-5844

National Stock Number (NSN) 6625-00-179-5844, or NIIN 001795844, (test set,semiconductor device) was assigned December 18, 1968 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 2 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, one supplier is listed as an Active supplier for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

This NSN is unique to one weapons system.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Apr 02, 1991, this NSN's acquisition method was noted as: Suitable for Competitive Acquisition. (Potential sources shall include dealers/distributors.) The Government physically does not have in its possession sufficient, accurate, or legible data to purchase this part from other than current source(s). (NOTE: This code is applicable only to parts under immediate buy requirements and only as long as the deficiency is under review for resolution and appropriate recoding.) Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625001795844 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE
ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE
AC VOLTAGE RATING
(ACYN) 115.0 VOLTS NOMINAL
ACCESSORY COMPONENT QUANTITY
(AFHS) 4
ACCESSORY CONTROLLING AGENCY
(AKVY) JETDS AND JETDS AND JETDS AND JETDS
ACCESSORY IDENTIFYING NUMBER
(AKVZ) TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO.
DC VOLTAGE RATING
(ACYR) 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM
FREQUENCY RATING
(ACZB) 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM
HEIGHT
(HGTH) 10.000 INCHES NOMINAL
INTERNAL BATTERY ACCOMMODATION
(ALSF) INCLUDED
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER
(AKWB) TYPE NO. AN/USM-206A
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME
(AKWA) TEST,SEMICONDUCTOR DEVICE
LENGTH
(ABRY) 9.000 INCHES NOMINAL
MAJOR COMPONENTS
(AEAS) TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST
MATERIAL
(MATT) PLASTIC CARRYING CASE
PHASE
(FAAZ) SINGLE
OPERATING TEST CAPABILITY
(AQXZ) METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST
TEST TYPE FOR WHICH DESIGNED
(AQXY) TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS
WIDTH
(ABGL) 8.000 INCHES NOMINAL
MATERIAL AND LOCATION
(ANNQ) PLASTIC CARRYING CASE
ACCESSORY COMPONENT QUANTITY
(AFHS) 1 AND 1 AND 1 AND 1
UNABLE TO DECODE
(ANNQ) UNABLE TO DECODE

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