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NSN 6625-00-202-3475, 6625002023475
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 002023475
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-00-202-3475

National Stock Number (NSN) 6625-00-202-3475, or NIIN 002023475, (test set,semiconductor device) was assigned April 6, 1973 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 3 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, one supplier is listed as an Active supplier for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Sep 02, 2000, this NSN's acquisition method was noted as: Acquire directly from the actual manufacturer, whether or not the prime contractor is the actual manufacturer. This part requires engineering source approval by the design control activity in order to maintain the quality of the part. An alternate source must qualify in accordance with the design control activity's procedures, as approved by the cognizant Government engineering activity. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625002023475 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

III FUNCTIONAL CLASSIFICATION
(FCLS) AA-3.2
ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
AC VOLTAGE RATING
(ACYN) 110.0 VOLTS MINIMUM AND 220.0 VOLTS MAXIMUM
ACCESSORY COMPONENT QUANTITY
(AFHS) 3
ACCESSORY IDENTIFYING NUMBER
(AKVZ) 013-0098-01 PART NO. AND 013-0111-00 PART NO. AND 337-1194-00 PART NO.
ACCESSORY CONTROLLING AGENCY
(AKVY) TEKTRONIX INC.
ELECTRICAL POWER SOURCE RELATIONSHIP
(AKWC) OPERATING
ENTRY DATE
(NTRD) 80-09-01
FUNCTIONAL CLASSIFICATION
(FCLS) AA-3.2
FUNCTIONAL DESCRIPTION
(FTLD) TESTS DC,2 & 3 TERMINAL DEVICES,& 16-PIN INLINE INTEGRATED CIRCUIT PACKAGES W/ APPROPRIATE DEVICE ADAPTERS; DISPLAYS SEMICONDUCTOR CHARACTERISTIC CURVES ON A C.R.T; HAS 2 POWER SUPPLIES TO DRIVE UUT; THE RESULTING CURRENT & VOLTAGE IS PLOTTED ON C.R.T. W/ VERTICAL AXIS DISPLAYING CURRENT & HORIZONTAL DISPLAYING VOLTAGE; COMPATIBLE TO 177 STANDARD TEST FIXTURE
INTERNAL BATTERY ACCOMMODATION
(ALSF) NOT INCLUDED
MAJOR COMPONENTS
(AEAS) STANDARD TEST FIXTURE,CURVE TRACER,CATHODE RAY TUBE DISPLAY
PHASE
(FAAZ) SINGLE
REFERENCE DATA AND LITERATURE
(RDAL) AF T.O. 33D7-77-26-1
TEST TYPE FOR WHICH DESIGNED
(AQXY) CHARACTERISTIC CURVES
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
III REFERENCE DATA AND LITERATURE
(RDAL) AF T.O. 33D7-77-26-1
III ENTRY DATE
(NTRD) 80-09-01

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