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NSN 6625-00-222-1117, 6625002221117
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 002221117
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-00-222-1117

National Stock Number (NSN) 6625-00-222-1117, or NIIN 002221117, (test set,semiconductor device) was assigned September 10, 1972 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 2 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, one supplier is listed as an Active supplier for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

There has been very little demand for this national stock number. The demand for this NSN originated from less than 5 countries. Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Apr 02, 2006, this NSN's acquisition method was noted as: Acquire only from the prime contractor although the engineering data identifies the Commercial and Government Entity Code (CAGE) and part number of a source other than the prime contractor. The annual buy value of this part falls below the screening threshold of $10,000 but it has been screened for known source(s). (NOTE: This code shall not be used when screening parts entering the inventory. It shall not be assigned in preference to or supersede any other AMSC.) Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625002221117 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

FSC APPLICATION DATA
(ZZZV) TEST SET,ELECT. EQUIP.
HEIGHT
(HGTH) 3.880 INCHES NOMINAL
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME
(AKWA) TEST SET,SEMICONDUCTOR DEVICE
JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER
(AKWB) TS-3253/TPM-39
OPERATING TEST CAPABILITY
(AQXZ) MICROAMPHERE METER RANGE 0-1000 UA DC
LENGTH
(ABRY) 5.500 INCHES NOMINAL
MATERIAL AND LOCATION
(ANNQ) ALUMINUM HOUSING
TEST TYPE FOR WHICH DESIGNED
(AQXY) MICROWAVE DIODE CURRENT
WIDTH
(ABGL) 4.250 INCHES NOMINAL
SURFACE TREATMENT
(SFTT) ENAMEL
SURFACE TREATMENT
(SURF) ENAMEL
III FSC APPLICATION DATA
(ZZZV) TEST SET,ELECT. EQUIP.
UNABLE TO DECODE
(SURF) UNABLE TO DECODE

Manufacturer Part Numbers


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