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NSN 6625-00-926-1341, 6625009261341
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 009261341
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-00-926-1341

National Stock Number (NSN) 6625-00-926-1341, or NIIN 009261341, (test set,semiconductor device) was assigned April 13, 1966 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There is only one manufacturer part number associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, there are no suppliers listed as an Active supplier for this NSN. Of the active suppliers, there are no suppliers that are deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625009261341 contains an unknown precious metal.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

INTERNAL BATTERY ACCOMMODATION
(ALSF) INCLUDED 1ST ALTERNATE OPERATING POWER RQMT
UNABLE TO DECODE
(ANNQ) UNABLE TO DECODE
INTERNAL BATTERY ACCOMMODATION
(ALSF) INCLUDED
DC VOLTAGE RATING
(ACYR) 13.5 VOLTS NOMINAL 1ST ALTERNATE OPERATING POWER RQMT
DC VOLTAGE RATING
(ACYR) 13.5 VOLTS NOMINAL
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE
ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE
ACCESSORY COMPONENT QUANTITY
(AFHS) 1
ACCESSORY CONTROLLING AGENCY
(AKVY) TEST EQUIPMENT CORP
ACCESSORY IDENTIFYING NUMBER
(AKVZ) TA-1 PART NO.
DC VOLTAGE RATING
(ACYR) UNABLE TO DECODE
HEIGHT
(HGTH) 6.000 INCHES NOMINAL
INTERNAL BATTERY ACCOMMODATION
(ALSF) UNABLE TO DECODE
LENGTH
(ABRY) 9.000 INCHES NOMINAL
MAJOR COMPONENTS
(AEAS) ADAPTER,TRANSISTOR
MATERIAL
(MATT) ALUMINUM CARRYING CASE
OPERATING TEST CAPABILITY
(AQXZ) AC CURRENT GAIN RANGE 3 TO 100 AND 30 TO 1000,AC TEST FREQ 1 KHZ PORM 10 PCT OF TOTAL; SATURATION VOLTAGE RANGE 0.3 TO 3V FULL SCALE; LEAKAGE CURRENT RANGE 0.03,0.3,3 OR 30 MA FULL SCALE AT 6V
TEST TYPE FOR WHICH DESIGNED
(AQXY) AC CURRENT GAIN; SATURATION; LEAKAGE CURRENT
WIDTH
(ABGL) 6.000 INCHES NOMINAL
MATERIAL AND LOCATION
(ANNQ) ALUMINUM CARRYING CASE

Manufacturer Part Numbers


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