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NSN 6625-00-933-5188, 6625009335188
Cancelled -> Replaced by 6625008203875

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 009335188
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-00-933-5188

National Stock Number (NSN) 6625-00-933-5188, or NIIN 009335188, (test set,semiconductor device) was assigned August 31, 1966 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN replaces 1 stock number, 6625008203875.

There is only one manufacturer part number associated with this NSN. One of those part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 3 suppliers. Today, 2 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625009335188 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
UNABLE TO DECODE
(ANNQ) UNABLE TO DECODE
FREQUENCY RATING
(ACZB) 60.0 HERTZ NOMINAL
SURFACE TREATMENT
(SURF) ENAMEL
INTERNAL BATTERY ACCOMMODATION
(ALSF) NOT INCLUDED
PHASE
(FAAZ) THREE
MATERIAL AND LOCATION
(ANNQ) STEEL HOUSING
UNABLE TO DECODE
(SURF) UNABLE TO DECODE
ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
AC VOLTAGE RATING
(ACYN) 120.0 VOLTS MINIMUM AND 208.0 VOLTS MAXIMUM 1ST ALTERNATE OPERATING POWER RQMT
FREQUENCY RATING
(ACZB) 60.0 HERTZ NOMINAL 1ST ALTERNATE OPERATING POWER RQMT
HEIGHT
(HGTH) 40.000 INCHES NOMINAL
INTERNAL BATTERY ACCOMMODATION
(ALSF) NOT INCLUDED 1ST ALTERNATE OPERATING POWER RQMT
LENGTH
(ABRY) 24.000 INCHES NOMINAL
MATERIAL
(MATT) STEEL HOUSING
OPERATING TEST CAPABILITY
(AQXZ) AMMETER RANGE 0 TO 200 A VOLTMETER RANGE 0 TO 500 V
PHASE
(FAAZ) THREE 1ST ALTERNATE OPERATING POWER RQMT
WIDTH
(ABGL) 21.000 INCHES NOMINAL
SURFACE TREATMENT
(SFTT) ENAMEL
TEST TYPE FOR WHICH DESIGNED
(AQXY) ELECTRICAL CHARACTERISTIC TEST FOR POWER TRANSISTORS POWER ZENER DIODE SEMICONDUCTOR DEVICE DIODE TRANSISTORS

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