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NSN 6625-00-993-3389, 6625009933389
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 009933389
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
Availability: Readily Available Qualified Suppliers: Currently qualifying suppliers

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DLMS® Summary

National Stock Number 6625-00-993-3389

National Stock Number (NSN) 6625-00-993-3389, or NIIN 009933389, (test set,semiconductor device) was assigned January 1, 1963 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 3 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 2 suppliers. Today, 2 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on May 02, 2001, this NSN's acquisition method was noted as: Suitable for Competitive Acquisition. (Potential sources shall include dealers/distributors.) The Government has unlimited rights to the technical data, and the data package is complete. Valid AMCs: 1 and 2.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625009933389 contains silver.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE
DC VOLTAGE RATING
(ACYR) 4.5 VOLTS MINIMUM AND 22.5 VOLTS MAXIMUM
FSC APPLICATION DATA
(ZZZV) TEST SET,TRANSISTOR,EXCEPT SPECIALLY DESIGNED
HEIGHT
(HGTH) 7.500 INCHES NOMINAL
INTERNAL BATTERY ACCOMMODATION
(ALSF) INCLUDED
LENGTH
(ABRY) 11.200 INCHES NOMINAL
PRECIOUS MATERIAL
(PRMT) SILVER
WIDTH
(ABGL) 10.700 INCHES NOMINAL
TEST TYPE FOR WHICH DESIGNED
(AQXY) MEASUREMENT OF TRANSISTOR CHARACTERISTICS
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/CARRYING CASE

Manufacturer Part Numbers


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