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NSN 6625-01-325-3672, 6625013253672
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 013253672
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-01-325-3672

National Stock Number (NSN) 6625-01-325-3672, or NIIN 013253672, (test set,semiconductor device) was assigned September 2, 1990 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 3 manufacturer part numbers associated with this NSN. One of those part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by one supplier. Today, one supplier is listed as an Active supplier for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on May 15, 2002, this NSN's acquisition method was noted as: Acquire directly from the actual manufacturer, whether or not the prime contractor is the actual manufacturer. The design of this part is unstable. Engineering, manufacturing, or performance characteristics indicate that the required design objectives have not been achieved. Major changes are contemplated because the part has a low process yield or has demonstrated marginal performance during tests or service use. These changes will render the present part obsolete and unusable in its present configuration. Limited acquisition from the present source is anticipated pending configuration changes. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625013253672 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

END ITEM IDENTIFICATION
(AGAV) GPETE
HEIGHT
(HGTH) 6.300 INCHES NOMINAL
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
LENGTH
(ABRY) 20.300 INCHES NOMINAL
TEST TYPE FOR WHICH DESIGNED
(AQXY) CURRENT VS VOLTAGE SIGNATURE ANALYSIS
WIDTH
(ABGL) 12.000 INCHES NOMINAL

Manufacturer Part Numbers


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