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NSN 6625-01-577-7189, 6625015777189
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 015777189
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-01-577-7189

National Stock Number (NSN) 6625-01-577-7189, or NIIN 015777189, (test set,semiconductor device) was assigned September 15, 2009 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 2 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 2 suppliers. Today, 2 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts. ISO Group has several sources of supply for this NSN.

This part number has not been procured by the US Government in over 5 years.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Oct 16, 2009, this NSN's acquisition method was noted as: Suitable for competitive acquisition for the first time. (Potential sources shall include dealers/distributors.) The Government has unlimited rights to the technical data, and the data package is complete. Valid AMCs: 1 and 2.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625015777189 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
AC VOLTAGE RATING
(ACYN) 110.0 VOLTS NOMINAL OR 240.0 VOLTS NOMINAL
ACCESSORY COMPONENT QUANTITY
(AFHS) 5
ELECTRICAL POWER SOURCE RELATIONSHIP
(AKWC) OPERATING
ENTRY DATE
(NTRD) 09-09-08
FREQUENCY RATING
(ACZB) 50.0 HERTZ MINIMUM AND 400.0 HERTZ MAXIMUM
FUNCTIONAL CLASSIFICATION
(FCLS) AA-9.6
FUNCTIONAL DESCRIPTION
(FTLD) USED TO IN-CIRCUIT TEST SEMICONDUCTOR COMPONENTS
INTERNAL BATTERY ACCOMMODATION
(ALSF) NOT INCLUDED
MAJOR COMPONENTS
(AEAS) TEST SET; PAIR MICROPROBES; COMMON TEST LEADS; SHROUDED TEST LEAD; POWER CORD; CD MANUAL
PART NAME ASSIGNED BY CONTROLLING AGENCY
(CXCY) TEST SET,SEMICONDUCTOR
PHASE
(FAAZ) SINGLE
PURCHASE DESCRIPTION IDENTIFICATION
(PDNB) 98752-PD09WRGBEC24
SPECIAL FEATURES
(FEAT) MEETS MIL-PRF-28800 CLASS 3
TEST TYPE FOR WHICH DESIGNED
(AQXY) IN-CIRCUIT ELECTRONIC COMPONENT TESTING
INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
PURCHASE DESCRIPTION IDENTIFICATION
(ZZZP) 98752-PD09WRGBEC24

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