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NSN 6625-01-581-4169, 6625015814169
TEST SET,SEMICONDUCTOR DEVICE

Federal Supply Classification
FSC 6625 - Electrical and Electronic Properties Measuring and Testing Instruments
National Item Identification Number
NIIN 015814169
Codification Country
United States
Item Name Code
INC 25006
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(P) There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product.
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DLMS® Summary

National Stock Number 6625-01-581-4169

National Stock Number (NSN) 6625-01-581-4169, or NIIN 015814169, (test set,semiconductor device) was assigned January 14, 2010 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 3 manufacturer part numbers associated with this NSN. None of the associated part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 2 suppliers. Today, 2 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, only one supplier is deemed design controlled or valid supply parts. ISO Group has several sources of supply for this NSN.

This part number has not been procured by the US Government in over 5 years.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Apr 10, 2013, this NSN's acquisition method was noted as: Acquire directly from the actual manufacturer, whether or not the prime contractor is the actual manufacturer. This part is a commercial/non-developmental/off-the-shelf-item. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 25006. [A TEST SET SPECIFICALLY DESIGNED FOR USE IN MAKING EXAMINATIONS OF DIODES, TRANSISTORS, AND THE LIKE. THESE EXAMINATIONS MAY BE EFFECTED IN OR OUT OF CIRCUIT OR BOTH.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no information in the HMIRS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product. NSN 6625015814169 does not contain precious metals.

This NSN is associated to Schedule B 9030908030: parts and accessories of articles of schedule b subheading 9030.39. The Schedule B End Use is listed as measuring, testing, control instruments. NAICS classification category 334515: instrument manufacturing for measuring and testing electricity and electrical signals.

This information was last updated on .


Technical Characteristics

INCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
ENCLOSURE FEATURE
(ANPZ) SINGLE ITEM W/HOUSING
AC VOLTAGE RATING
(ACYN) 100.0 VOLTS NOMINAL OR 115.0 VOLTS NOMINAL OR 230.0 VOLTS NOMINAL
DEPTH
(AEJZ) 8.500 INCHES NOMINAL
ELECTRICAL POWER SOURCE RELATIONSHIP
(AKWC) OPERATING
ENTRY DATE
(NTRD) 10-01-14
FREQUENCY RATING
(ACZB) 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM
FUNCTIONAL CLASSIFICATION
(FCLS) AA-1.3
FUNCTIONAL DESCRIPTION
(FTLD) USED TO TEST PASSIVE DEVICES, DIODES, TRANSISTORS, GATED DEVICES, OPTOELECTRONIC DEVICES, AND INTEGRATED CIRCUITS
HEIGHT
(HGTH) 4.400 INCHES NOMINAL
PHASE
(FAAZ) SINGLE
OPERATING TEST CAPABILITY
(AQXZ) FREQUENCIES 20, 50, 60, 200, 500, AND 2KHZ; VOLTAGES 200MILLI, 3, 5, 10, 15, AND 20V; RESISTANCE 10, 50, 100,500, 1K, 5K, 10K, 50K, 100K OHMS
RELATIONSHIP TO SIMILAR EQUIPMENT
(RTSE) TRACKER 2800S CAN SCAN MULTI-PIN
TEST TYPE FOR WHICH DESIGNED
(AQXY) RESISTANCE, CAPACITANCE, INDUCTANCE
WIDTH
(ABGL) 11.100 INCHES NOMINAL

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