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NSN 5961-00-407-4593, 5961004074593
SEMICONDUCTOR DEVICE SET

Federal Supply Classification
FSC 5961 - Semiconductor Devices and Associated Hardware
National Item Identification Number
NIIN 004074593
Codification Country
United States
Item Name Code
INC 20590
Criticality
(X) This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Hazardous Material Indicator Code
(N) There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials.
Availability: Readily Available Qualified Suppliers: Currently qualifying suppliers

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DLMS® Summary

National Stock Number 5961-00-407-4593

National Stock Number (NSN) 5961-00-407-4593, or NIIN 004074593, (semiconductor device set) was assigned January 20, 1972 in the Federal Logistics Information System (FLIS). This NIIN is Available for Manual Assignment. This NSN does not replace any other NSNs.

There are 5 manufacturer part numbers associated with this NSN. 3 of those part number(s) are considered obsolete. The manufacturer part numbers were originally supplied by 10 suppliers. Today, 7 suppliers are listed as Active suppliers for this NSN. Of the active suppliers, 3 suppliers are deemed design controlled or valid supply parts.

This part number has not been procured by the US Government in over 5 years.

This NSN is fairly common among different weapons systems, belonging to 22 different platforms.

Based on a planned procurement review by the Primary Inventory Control Activity (PICA) on Aug 01, 2020, this NSN's acquisition method was noted as: Suitable for Competitive Acquisition. (Potential sources shall include dealers/distributors.) This part requires engineering source approval by the design control activity in order to maintain the quality of the part. An alternate source must qualify in accordance with the design control activity's procedures, as approved by the cognizant Government engineering activity. Valid AMCs: 1, 2, 3, 4 and 5.

This NSN is assigned to Item Name Code (INC) 20590. [A GROUPING OF TWO OR MORE INDIVIDUAL SEMICONDUCTOR DEVICES, SUCH AS TRANSISTORS, DIODES, AND PHOTO SEMICONDUCTOR DEVICES. IT INCLUDES MATCHED PAIRS. EXCLUDES:ABSORBER, OVERVOLTAGE; SEMICONDUCTOR DEVICE ASSEMBLY. FOR INTERCONNECTED ITEMS FUNCTIONING AS POWER SUPPLY RECTIFIERS, SEE RECTIFIER, SEMICONDUCTOR DEVICE.]. This item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. There is no data in the HMIRS and the NSN is in an FSC not generally suspected of containing hazardous materials. NSN 5961004074593 contains an unknown precious metal.

This NSN is associated to Schedule B 8541500080: semiconductor devices, nesoi. The Schedule B End Use is listed as semiconductors. NAICS classification category 334413: semiconductor and related device manufacturing.

This information was last updated on .


Technical Characteristics

TERMINAL LENGTH
(ABJT) 0.500 INCHES MINIMUM ALL TRANSISTOR
INTERNAL CONFIGURATION
(ALAS) JUNCTION CONTACT ALL TRANSISTOR
OVERALL LENGTH
(ABHP) 0.240 INCHES MINIMUM AND 0.260 INCHES MAXIMUM ALL TRANSISTOR
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION
(ALAZ) TO-39 ALL TRANSISTOR
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) 175.0 DEG CELSIUS JUNCTION ALL TRANSISTOR
TERMINAL TYPE AND QUANTITY
(TTQY) 3 UNINSULATED WIRE LEAD ALL TRANSISTOR
OVERALL DIAMETER
(ADAV) 0.350 INCHES MINIMUM AND 0.370 INCHES MAXIMUM ALL TRANSISTOR
MOUNTING METHOD
(AXGY) TERMINAL ALL TRANSISTOR
POWER RATING PER CHARACTERISTIC
(CTRD) 800.0 MILLIWATTS MAXIMUM TOTAL DEVICE DISSIPATION ALL TRANSISTOR
COMPONENT FUNCTION RELATIONSHIP
(ASDD) MATCHED
COMPONENT NAME AND QUANTITY
(ASKA) 2 TRANSISTOR
CURRENT RATING PER CHARACTERISTIC
(CTQX) UNABLE TO DECODE
FEATURES PROVIDED
(CBBL) HERMETICALLY SEALED CASE
INTERNAL CONFIGURATION
(ALAS) UNABLE TO DECODE
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION
(ALAZ) UNABLE TO DECODE
INTERNAL JUNCTION CONFIGURATION
(ASCQ) UNABLE TO DECODE
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) UNABLE TO DECODE
MOUNTING METHOD
(AXGY) UNABLE TO DECODE
POWER RATING PER CHARACTERISTIC
(CTRD) UNABLE TO DECODE
SEMICONDUCTOR MATERIAL
(CTMZ) UNABLE TO DECODE
TERMINAL LENGTH
(ABJT) UNABLE TO DECODE
TERMINAL TYPE AND QUANTITY
(TTQY) UNABLE TO DECODE
SEMICONDUCTOR MATERIAL
(CTMZ) SILICON ALL TRANSISTOR
CURRENT RATING PER CHARACTERISTIC
(CTQX) 1.00 AMPERES SOURCE CUTOFF CURRENT MAXIMUM ALL TRANSISTOR
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT
(CTSG) 175.0 CELSIUS JUNCTION ALL TRANSISTOR
INCLOSURE MATERIAL
(ABBH) METAL ALL TRANSISTOR
UNABLE TO DECODE
(ABBH) UNABLE TO DECODE
INTERNAL JUNCTION CONFIGURATION
(ASCQ) NPN ALL TRANSISTOR
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC
(CTQN) 50.0 MINIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN AND 75.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-BASE, EMITTER OPEN ALL TRANSISTOR
CURRENT RATING PER CHARACTERISTIC
(CTQX) 1.00 AMPERES MAXIMUM COLLECTOR CURRENT, DC ALL TRANSISTOR
POWER RATING PER CHARACTERISTIC
(CTRD) 800.0 MILLIWATTS SMALL-SIGNAL INPUT POWER, COMMON-COLLECTOR ABSOLUTE ALL TRANSISTOR

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